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Skip Navigation LinksCVI Melles Griot Home Page > Products > Instruments > Beam Alignment and Position Measurement > Spot-On™ <br>Lateral-Effect Detector Systems
 
 
PSL, PSN - Spot-On™
Lateral-Effect Detector Systems

 
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Dual-axis lateral-effect detectors are ideal for measuring alignment and large beam deflections. Unlike quadrant detectors, they can measure the position of the beam anywhere within the surface of the detector. Dual sensors and custom housings are available. Please contact CVI Melles Griot application engineers for more information.

13 PSL-series lateral-effect detector system
 
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